In most cases, unscheduled down-time due to faulty or marginal components can be avoided by testing the Power Semiconductors regularly during scheduled outages or service days. It is imperative that only instruments specifically designed for testing Power Semiconductors are used. Meggers and hi-potters should under no circumstances be used, since these kinds of instruments can easily damage the components. Ohm meters are
reliable to detect a short, since they do not have enough voltage to properly energize the silicon wafer in a Power Semiconductor.
See the information packets below or contact us
for further information.